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Time-domain thermoreflectance technique using multiple delayed probe pulses for high-throughput data acquisition and analysis.

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第一作者： Hiroto,Arima

第一单位： National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki, Japan.

作者： Hiroto,Arima ^[1] ; Yuichiro,Yamashita ^[1] ; Takashi,Yagi ^[1]

作者单位： National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki, Japan. ^[1]

关键词 Time-domain thermoreflectance interfacial thermal resistance machine learning multiple delay thermal effusivity thin film

DOI 10.1080/14686996.2025.2523240

PMID 40667527

发布时间 2025-07-18

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Science and technology of advanced materials

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Time-domain thermoreflectance technique using multiple delayed probe pulses for high-throughput data acquisition and analysis.

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Time-domain thermoreflectance technique using multiple delayed probe pulses for high-throughput data acquisition and analysis.

Science and technology of advanced materials

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Science and technology of advanced materials

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