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Soft-Error-Resilient Static Random Access Memory with Enhanced Write Ability for Radiation Environments.

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第一作者： Se-Yeon,Park

第一单位： Department of Semiconductor Engineering, Tech University of Korea, Siheung 15073, Republic of Korea.

作者： Se-Yeon,Park ^[1] ; Eun Gyo,Jeong ^[2] ; Sung-Hun,Jo ^[3]

作者单位： Department of Semiconductor Engineering, Tech University of Korea, Siheung 15073, Republic of Korea. ^[1] Department of Electronics Engineering, Incheon National University (INU), 119 Academy-ro, Yeonsu-gu, Incheon 22012, Republic of Korea. ^[2] Division of System Semiconductor, Dongguk University, Seoul 04620, Republic of Korea. ^[3]

关键词 critical charge single event upset (SEU)single-event-multi-node-upset (SEMNU)write access time write stability

DOI 10.3390/mi16111212

PMID 41302731

发布时间 2025-11-30

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