第一单位：
Department of Intelligence Semiconductor Engineering, Ajou University, 206, World cup-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do, Republic of Korea.
作者：
Jae-Hyun,Kim [1]
;
Hyojeong,Choi [2]
;
Kenjiro,Fukuda [3]
;
Jaebin,Jeong [1]
;
Jun-Gyu,Choi [4]
;
Sunghoon,Lee [5]
;
Tomoyuki,Yokota [6]
;
Sang Min,Won [7]
;
Joohoon,Kang [8]
;
Yei Hwan,Jung [9]
;
Jongin,Hong [10]
;
Seulki,Song [11]
;
Takao,Someya [12]
;
Hyeok,Kim [13]
;
Sungjun,Park [14]
作者单位：
Department of Intelligence Semiconductor Engineering, Ajou University, 206, World cup-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do, Republic of Korea.
[1]
School of Electrical and Computer Engineering, University of Seoul, 55, Seoulsiripdae-ro, Dongdaemun-gu, Seoul, Republic of Korea.
[2]
Division of Electrical, Electronic and Infocommunications Engineering, Graduate School of Engineering, The University of Osaka, 2-1 Yamada-oka, Suita, Osaka, Japan.;Thin-Film Device Laboratory, RIKEN, Wako, Saitama, Japan.
[3]
Department of Electrical and Computer Engineering, Ajou University, Gyeonggi-do, Republic of Korea.
[4]
Thin-Film Device Laboratory, RIKEN, Wako, Saitama, Japan.;RIKEN Center for Emergent Matter Science, 2-1 Hirosawa, Wako, Saitama, Japan.;Department of Electrical Engineering and Information Systems, School of Engineering, The University of Tokyo, Tokyo, Japan.
[5]
Department of Electrical Engineering and Information Systems, School of Engineering, The University of Tokyo, Tokyo, Japan.
[6]
Department of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, Republic of Korea.
[7]
Department of Chemical and Biomolecular Engineering, Yonsei University, Seoul, Republic of Korea.
[8]
Department of Electronic Engineering, Hanyang University, Seoul, Republic of Korea.
[9]
Department of Chemistry, Chung-Ang University, Seoul, Republic of Korea.
[10]
Department of Chemical Engineering and Applied Chemistry, Chungnam National University (CNU), 99 Daehak-Ro, Yuseong-gu, Daejeon, Republic of Korea.
[11]
Thin-Film Device Laboratory, RIKEN, Wako, Saitama, Japan. someya@ee.t.u-tokyo.ac.jp.;RIKEN Center for Emergent Matter Science, 2-1 Hirosawa, Wako, Saitama, Japan. someya@ee.t.u-tokyo.ac.jp.;Department of Electrical Engineering and Information Systems, School of Engineering, The University of Tokyo, Tokyo, Japan. someya@ee.t.u-tokyo.ac.jp.
[12]
School of Electrical and Computer Engineering, University of Seoul, 55, Seoulsiripdae-ro, Dongdaemun-gu, Seoul, Republic of Korea. hyeok.kim@uos.ac.kr.;Department of Intelligent Semiconductor Engineering, University of Seoul, Seoul, Republic of Korea. hyeok.kim@uos.ac.kr.
[13]
Department of Intelligence Semiconductor Engineering, Ajou University, 206, World cup-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do, Republic of Korea. sj0223park@ajou.ac.kr.;Department of Electrical and Computer Engineering, Ajou University, Gyeonggi-do, Republic of Korea. sj0223park@ajou.ac.kr.
[14]
DOI
10.1038/s41467-025-66649-0
PMID
41397975
发布时间
2025-12-18
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