The Use of Atomic Force Microscopy in Comprehensive Assessment of the "Mother-Placenta-Fetus" System in Obstetric and Endocrine Pathology during Pregnancy-论文-万方医学网

The Use of Atomic Force Microscopy in Comprehensive Assessment of the "Mother-Placenta-Fetus" System in Obstetric and Endocrine Pathology during Pregnancy

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作者： Pavlova, T., V ^[1] ; Shchegolev, A., I ^[2] ; Kaplin, A. N. ^[3] ; Malyutina, E. S. ; Selivanova, A., V ; Zemlyanskaya, L. O.

作者单位： Minist Hlth Russian Federat,VI Kulakov Natl Med Res Ctr Obstet Gynecol & Peri ^[1] Belgorod State Natl Res Univ ^[2] Minist Hlth Russian Federat,Kursk State Med Univ ^[3]

关键词 scanning microscopy obstetrics placenta uterus

发布时间 2022-05-28

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The Use of Atomic Force Microscopy in Comprehensive Assessment of the "Mother-Placenta-Fetus" System in Obstetric and Endocrine Pathology during Pregnancy

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The Use of Atomic Force Microscopy in Comprehensive Assessment of the "Mother-Placenta-Fetus" System in Obstetric and Endocrine Pathology during Pregnancy

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