摘要原发性免疫缺陷病(PID)是一类由于单基因突变导致免疫细胞、免疫分子数量异常和/或功能缺陷的疾病。PID患者易反复感染，伴过敏、自身免疫、自身炎症和恶性肿瘤性疾病，疾病的致死、致残率极高，早期诊断和治疗有助于改善预后。目前已知的PID筛查技术包括T淋巴细胞受体剪切环筛查重症联合免疫缺陷病，Kappa重排剪切环筛查无丙种球蛋白血症，串联质谱法筛查腺苷脱氨酶缺陷和嘌呤核苷磷酸化酶缺陷，蛋白组学筛查特定的蛋白缺陷以及二代测序技术筛查基因变异。现就目前PID的早期筛查技术进行简要总结，为日后我国筛查工作的开展提供参考。

abstractsPrimary immune deficiency disease (PID), caused by a single gene mutation, is caused by the abnormal number and function of immune cells and molecules.PID patients are prone to repeated infection, accompanied by allergy, autoimmunity, auto-inflammation and malignant diseases.The mortality and disability rates of PID are very high.Early diagnosis and treatment are helpful to improve the prognosis.At present, existing screening methods for PID include newborn screening for severe combined immunodeficiency disease using the T cell receptor excision circle assay, screening for agammaglobulinemia using the immunoglobulin Kappa recombining excision circle assay, screening for adenosine deaminase deficiency and purine nucleoside phosphorylase deficiency using the tandem mass spectrometry, screening for specific protein defects using the proteomics, and screening for genetic variates using the next-generation sequencing.This review briefly summarized the current newborn screening technologies for PID, thus providing references for the development of screening PID in the future.