摘要目的 总结分析脑深部电刺激术(deep brain stimulation,DBS)后和硬件相关并发症发生原因及改进方法.方法 回顾性总结221例DBS术后病人和硬件相关并发症的发生情况.2例病人凶颅内出血没有统计在内.219例病人共植入328侧电极.结果 随访时间3-35个月,平均16.1个月.219例病人共发生和DBS硬件相关的并发症26例(11.9%)涉及21侧电极(6.4%).切口感染和(或)破溃12例(5.5%),异物反应2例(0.9%),电极短路和断路4例(1.8%),脑脊液漏3例(1.4%),电极移位5例(2.3%).其中切口感染和(或)破溃的发生率最高.结论 通过对DBS和硬件相关并发症的分析表明上述并发症的发生率是十分可观的.预防减少并发症的发生和改进处理方法 可以使DBS更充分地发挥其治疗作用.

abstractsObjective To study the long-term hardware.-related complications of deep brain stimulation(DBS). Method The study design was a retrospective chart review of two surgeons, single-institution experience with DBS in 221 consecutive cases from Jan 2006 to August 2008. Two patients were excluded because the procedure was aborted owing to hemorrhage. 219 patients received 328 permanent DBS electrode implants. Results The follow-up time was ranged from 3 to 35 months. The mean follow-up period was 16. 1 months. Overall ,26 patients(11.9%) had 26 hardware-related complications involving 21 (6. 4%) electrodes. There were 5 lead migrations,4 short or open circuits, 12 erosions and (or) infections, 2 foreign body reactions, and 3 cerebrospinal fluid leak. A significant finding was a large number of complications involving erosions or infections. Conclusions Long-term follow-up reveals that hardware -related complications occur in a significant large number of patients. Factors that lead to such complications must be identified and addressed to maximize the important benefits of DBS therapy.